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Assessment of homogeneity of candidate reference material at the nanogram level and investigation on representativeness of single particle analysis using electron probe X-ray microanalysis
Ro, C.-U.; Hoornaert, S.; Van Grieken, R. (1999). Assessment of homogeneity of candidate reference material at the nanogram level and investigation on representativeness of single particle analysis using electron probe X-ray microanalysis. Anal. Chim. Acta 389: 151-160
In: Analytica Chimica Acta. Elsevier: New York; Amsterdam. ISSN 0003-2670, more
Peer reviewed article  

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  • Ro, C.-U.
  • Hoornaert, S.
  • Van Grieken, R., more

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