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Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level
Hoornaert, S.; Treiger, B.; Valkovic, V.; Van Grieken, R. (1998). Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level. Microchim. Acta 128: 207-213
In: Microchimica Acta. Springer Verlag: Wien; New York. ISSN 0026-3672, more
Peer reviewed article  

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Authors  Top 
  • Hoornaert, S.
  • Treiger, B.
  • Valkovic, V.
  • Van Grieken, R., more

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