Polycapillary based confocal detection schemes for XRF micro- and nano-spectroscopy
Bart Vekemans, Björn De Samber, Tom Schoonjans, Geert Silversmit, Laszlo Vincze, Sylvia Schmitz, Frank Brenker, Roel Evens, Karel De Schamphelaere, Colin Janssen, Bert Masschaele, Luc Van Hoorebeke, Rémi Tucoulou, Peter Cloetens, Manfred Burghammer, Jean Susini, Christian Riekel (2009). Polycapillary based confocal detection schemes for XRF micro- and nano-spectroscopy, in: Book of abstracts of the 58th Annual Denver X-ray Conference.
In: (2009). Book of abstracts of the 58th Annual Denver X-ray Conference. International Centre for Diffraction Data: Denver.
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