From pixels to patterns: high-throughput image classification and morphometry through a new PI-10 imaging pipeline

Mortelmans, J.; Decrop, W.; Heynderickx, H.; Cattrijsse, A.; Depaepe, M.; van Walraven, L.; Scott, J.D.; van Oevelen, D.; Deneudt, K.; Muñiz, C.


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From pixels to patterns: high-throughput image classification and morphometry through a new PI-10 imaging pipeline

Mortelmans, J.; Decrop, W.; Heynderickx, H.; Cattrijsse, A.; Depaepe, M.; van Walraven, L.; Scott, J.D.; van Oevelen, D.; Deneudt, K.; Muñiz, C. (2025). From pixels to patterns: high-throughput image classification and morphometry through a new PI-10 imaging pipeline, in: Praet, N. et al. Particles in Europe 2025: Conference program and proceedings, 17 - 19 September 2025, Ostend, Belgium. pp. 54-60

In: Praet, N.; Plancke, Y. (Ed.) (2025). Particles in Europe 2025: Conference program and proceedings, 17 - 19 September 2025, Ostend, Belgium. Flanders Marine Institute/Flanders Hydraulics/Institute of Natural Sciences/Sequoia Scientific Inc.: Ostend. XIX, 246 pp. https://dx.doi.org/10.48607/346

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VLIZ: Open access 419375 [ download pdf ]
Document type: Conference paper

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Mortelmans, J. Decrop, W. Heynderickx, H. Cattrijsse, A., more	Depaepe, M. van Walraven, L. Scott, J.D.	van Oevelen, D. Deneudt, K., more Muñiz, C.

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