Micro and Trace X-ray Analysis, JST Symposium, Abstracts
(2009). Micro and Trace X-ray Analysis, JST Symposium, Abstracts. Sowa Information Control Center: Osaka.
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- Björn De Samber, Roel Evens, Karel De Schamphelaere, Bert Masschaele, Geert Silversmit, Tom Schoonjans, Bart Vekemans, Luc Van Hoorebeke, Frank Vanhaecke, Colin Janssen, Sylvain Bohic, Gerd Wellenreuther, Karen Rickers, Gerald Falkenberg, Laszlo Vincze (2009). Laboratory and synchrotron radiation micro and nano X-ray fluorescence, in: Micro and Trace X-ray Analysis, JST Symposium, Abstracts. pp. 45-46, meer
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